A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow

Chapter Title

A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow

Files

Department

Electronics & Communications Engineering Department

Description

[abstract not available]

Publication Date

12-28-2011

Document Type

Book Chapter

Book Title

International System on Chip Conference

ISBN

SCOPUS_ID:84255200986

Publisher

IEEE

City

Taipei, Taiwan

First Page

231

Last Page

236

Keywords

design for manufacturing, Design-For-Manufacturability, DFM, e-DFM, e-hotspot, Electrical Design For Manufacturability, electrical design for manufacturing, Lithography variations, Parametric Yield, Process variations, Stress effects

A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow

Share

COinS