High performance electrical driven hotspot detection solution for full chip design using a novel device parameter matching technique

Chapter Title

High performance electrical driven hotspot detection solution for full chip design using a novel device parameter matching technique

Files

Department

Electronics & Communications Engineering Department

Description

[abstract not available]

Publication Date

7-16-2012

Document Type

Book Chapter

Book Title

Proceedings - International Symposium on Quality Electronic Design, ISQED

ISBN

SCOPUS_ID:84863640286

Publisher

IEEE

City

Santa Clara, CA, USA

First Page

223

Last Page

227

Keywords

Design-For-Manufacturability (DFM), Electrical Design-For-Manufacturability (e-DFM), Hot spots, Lithography variations, Parametric Yield, Process variations, Stress effects

High performance electrical driven hotspot detection solution for full chip design using a novel device parameter matching technique

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