Testing of N-stage pipelined ADC using test input regeneration and sliding window techniques

Authors

Sahar M. Hamed, Cairo University, Faculty of Engineering
Ahmed H. Khalil, Cairo University, Faculty of Engineering
M. B. Abdelhalim, Arab Academy for Science, Technology and Maritime Transport
Hassanein H. Amer, American University in CairoFollow
Ahmed H. Madian, Atomic Energy Authority of Egypt

Files

Department

Electronics & Communications Engineering Department

Description

[abstract not available]

Publication Date

9-18-2013

Document Type

Book Chapter

Book Title

2013 3rd International Conference on Communications and Information Technology, ICCIT 2013

ISBN

SCOPUS_ID:84883857648

Publisher

IEEE

City

Beirut, Lebanon

First Page

366

Last Page

370

Keywords

1.5 bit per stage, PADC, Sliding Window Technique, Test Input Regeneration

Recommended Citation

APA Citation

Hamed, S. Khalil, A. Abdelhalim, M. Amer, H. & Madian, A. (2013).Testing of N-stage pipelined ADC using test input regeneration and sliding window techniques. IEEE. , 366-370
https://fount.aucegypt.edu/faculty_book_chapters/559

MLA Citation

Hamed, Sahar M., et al. Testing of N-stage pipelined ADC using test input regeneration and sliding window techniques. IEEE, 2013.pp. 366-370
https://fount.aucegypt.edu/faculty_book_chapters/559