Effect of the resistance of open and short faults on the production testing of MCML gates

Chapter Title

Effect of the resistance of open and short faults on the production testing of MCML gates

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Department

Electronics & Communications Engineering Department

Description

[abstract not available]

Publication Date

11-4-2014

Document Type

Book Chapter

Book Title

Proceedings of the Biennial Baltic Electronics Conference, BEC

ISBN

SCOPUS_ID:84971254290

Publisher

IEEE

City

Tallinn, Estonia

First Page

81

Last Page

84

Keywords

CMOS, current mode, fault model, testing

Effect of the resistance of open and short faults on the production testing of MCML gates

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