Testing of memristor ratioed logic (MRL) XOR gate

Chapter Title

Testing of memristor ratioed logic (MRL) XOR gate

Files

Department

Electronics & Communications Engineering Department

Description

[abstract not available]

Publication Date

7-2-2016

Document Type

Book Chapter

Book Title

Proceedings of the International Conference on Microelectronics, ICM

ISBN

SCOPUS_ID:85014893425

Publisher

IEEE

City

Giza, Egypt

First Page

181

Last Page

184

Keywords

fault coverage, fault model, Memristors, MRL, production testing, XOR

Testing of memristor ratioed logic (MRL) XOR gate

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