Effect of open faults in FPGA switch matrices on fault detection mechanisms

Authors

Manar N. Shaker, American University in Cairo
A. H. Madian, Atomic Energy Authority of Egypt
M. B. Abdelhalim, Arab Academy for Science, Technology and Maritime Transport
Sherif H. Amer, American University in Cairo
Ahmed S. Emara, American University in Cairo

Files

Department

Electronics & Communications Engineering Department

Description

[abstract not available]

Publication Date

7-2-2016

Document Type

Book Chapter

Book Title

Proceedings of the International Conference on Microelectronics, ICM

ISBN

SCOPUS_ID:85014963180

Publisher

IEEE

City

Giza, Egypt

First Page

233

Last Page

236

Keywords

fault detection, FPGA, programmable multiplexer, switch matrix

Recommended Citation

APA Citation

Shaker, M. Madian, A. Abdelhalim, M. Amer, S. & Emara, A. (2016).Effect of open faults in FPGA switch matrices on fault detection mechanisms. IEEE. , 233-236
https://fount.aucegypt.edu/faculty_book_chapters/328

MLA Citation

Shaker, Manar N., et al. Effect of open faults in FPGA switch matrices on fault detection mechanisms. IEEE, 2016.pp. 233-236
https://fount.aucegypt.edu/faculty_book_chapters/328