A low power self-healing resilient microarchitecture for PVT variability mitigation

Authors

Shady Agwa, American University in Cairo
Eslam Yahya, The Ohio State University
Yehea Ismail, American University in CairoFollow

Files

Department

Electronics & Communications Engineering Department

Description

[abstract not available]

Publication Date

6-1-2018

Document Type

Book Chapter

Book Title

IEEE Transactions on Circuits and Systems I: Regular Papers

ISBN

SCOPUS_ID:85037654083

Publisher

IEEE

City

Piscataway, New Jersey

First Page

1909

Last Page

1918

Keywords

Error detection, Error recovery, Low power, MAC unit, Pipeline recovery, Process voltage temperature (PVT) variations, Resilient microarchitecture, Self-healing architecture

Recommended Citation

APA Citation

Agwa, S. Yahya, E. & Ismail, Y. (2018).A low power self-healing resilient microarchitecture for PVT variability mitigation. IEEE. , 1909-1918
https://fount.aucegypt.edu/faculty_book_chapters/211

MLA Citation

Agwa, Shady, et al. A low power self-healing resilient microarchitecture for PVT variability mitigation. IEEE, 2018.pp. 1909-1918
https://fount.aucegypt.edu/faculty_book_chapters/211