A thesis presented on the effects of space radiation on the flash-based FPGA leading to failure with applying a proposed fault model to identify the worst, nominal and best-case test vectors for each. This thesis analyzed the delay failure induced in a flash-based field programmable gate array (FPGA) by a total-ionizing dose. It then identified the different factors contributing to the amount of delay induced by the total dose in the FPGA. A novel fault model for delay failure in FPGA was developed. This fault model was used to identify worst-case test vectors for delay failures induced in FPGA devices exposed to a total ionizing dose. The fault model and the methodology for identifying worst-case test vectors WCTV were validated using Micro-semi ProASIC3 FPGA and Cobalt 60 radiation facility.
Electronics & Communications Engineering Department
MS in Electronics & Communication Engineering
Online Submission Date
Committee Member 1
Committee Member 2
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(2015).Identifying Worst-Case Test Vectors for Delay Failures Induced by Total Dose in Flash- based FPGA [Master’s thesis, the American University in Cairo]. AUC Knowledge Fountain.
Ammar, Adel. Identifying Worst-Case Test Vectors for Delay Failures Induced by Total Dose in Flash- based FPGA. 2015. American University in Cairo, Master's thesis. AUC Knowledge Fountain.