A thesis presented on the effects of space radiation on the flash-based FPGA leading to failure with applying a proposed fault model to identify the worst, nominal and best-case test vectors for each. This thesis analyzed the delay failure induced in a flash-based field programmable gate array (FPGA) by a total-ionizing dose. It then identified the different factors contributing to the amount of delay induced by the total dose in the FPGA. A novel fault model for delay failure in FPGA was developed. This fault model was used to identify worst-case test vectors for delay failures induced in FPGA devices exposed to a total ionizing dose. The fault model and the methodology for identifying worst-case test vectors WCTV were validated using Micro-semi ProASIC3 FPGA and Cobalt 60 radiation facility.
Electronics & Communications Engineering Department
MS in Electronics & Communication Engineering
Committee Member 1
Committee Member 2
The author retains all rights with regard to copyright. The author certifies that written permission from the owner(s) of third-party copyrighted matter included in the thesis, dissertation, paper, or record of study has been obtained. The author further certifies that IRB approval has been obtained for this thesis, or that IRB approval is not necessary for this thesis. Insofar as this thesis, dissertation, paper, or record of study is an educational record as defined in the Family Educational Rights and Privacy Act (FERPA) (20 USC 1232g), the author has granted consent to disclosure of it to anyone who requests a copy.
Institutional Review Board (IRB) Approval
Not necessary for this item
(2015).Identifying Worst-Case Test Vectors for Delay Failures Induced by Total Dose in Flash- based FPGA [Master's Thesis, the American University in Cairo]. AUC Knowledge Fountain.
Ammar, Adel. Identifying Worst-Case Test Vectors for Delay Failures Induced by Total Dose in Flash- based FPGA. 2015. American University in Cairo, Master's Thesis. AUC Knowledge Fountain.